New approach to the strain relaxation mechanism in lattice-mismatched epitaxy
β Scribed by H. Tatsuoka; H. Kuwabara; Y. Nakanishi; H. Fujiyasu
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 606 KB
- Volume
- 201
- Category
- Article
- ISSN
- 0040-6090
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π SIMILAR VOLUMES
We present a new approach to the analysis of the decay of voltage V with time c after a current pulse has been applied to an electrochemical system. We show that a plot of -td V/dt is an approximation to the spectrum of relaxation times that characterize the decay of Vas a combination ofexponential
## Abstract The Gerber, modified Goodman, Soderberg, Bagci, ASMEβelliptic and Clemson diagrams are proposed for estimating mechanical element fatigue strength under positive mean and alternating stresses. However, all of these diagrams are either conservative or have fields containing stress greate