✦ LIBER ✦
New Approach for Measuring Lateral Diffusion in Langmuir Monolayers by Scanning Electrochemical Microscopy (SECM): Theory and Application
✍ Scribed by Zhang, Jie; Slevin, Christopher J.; Morton, Colin; Scott, Peter; Walton, David J.; Unwin, Patrick R.
- Book ID
- 125980721
- Publisher
- American Chemical Society
- Year
- 2001
- Tongue
- English
- Weight
- 147 KB
- Volume
- 105
- Category
- Article
- ISSN
- 0022-3654
No coin nor oath required. For personal study only.