New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy
✍ Scribed by A. G. B. M. Sasse; H. Wormeester; A. Van Silfhout
- Publisher
- John Wiley and Sons
- Year
- 1988
- Tongue
- English
- Weight
- 504 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0142-2421
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
## Abstract The need to align the electron beam, the electron spectrometer axis and the ion beam all at the same point on the sample surface in sputter‐depth profiling using Auger electron spectroscopy is crucial to the attainment of efficient high‐resolution profiles. In this study we develop a me
A new model-free method is presented that automatically corrects for phase shifts, frequency shifts, and additional lineshape distortions of one single resonance peak across a series of in vivo NMR spectra. All separate phase and frequency variations are quickly and directly derived from the common