𝔖 Bobbio Scriptorium
✦   LIBER   ✦

New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy

✍ Scribed by A. G. B. M. Sasse; H. Wormeester; A. Van Silfhout


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
504 KB
Volume
13
Category
Article
ISSN
0142-2421

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Method for the alignment of samples and
✍ C. P. Hunt; M. P. Seah 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 627 KB

## Abstract The need to align the electron beam, the electron spectrometer axis and the ion beam all at the same point on the sample surface in sputter‐depth profiling using Auger electron spectroscopy is crucial to the attainment of efficient high‐resolution profiles. In this study we develop a me

Automatic Correction for Phase Shifts, F
✍ H Witjes; W.J Melssen; H.J.A in ‘t Zandt; M van der Graaf; A Heerschap; L.M.C Bu 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 200 KB

A new model-free method is presented that automatically corrects for phase shifts, frequency shifts, and additional lineshape distortions of one single resonance peak across a series of in vivo NMR spectra. All separate phase and frequency variations are quickly and directly derived from the common