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Neutron-induced soft error rate measurements in semiconductor memories

✍ Scribed by Kenan Ünlü; Vijaykrishnan Narayanan; Sacit M. Çetiner; Vijay Degalahal; Mary J. Irwin


Book ID
103856454
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
372 KB
Volume
579
Category
Article
ISSN
0168-9002

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