✦ LIBER ✦
Neural network reinforced point defect concentration estimation model for Czochralski-grown silicon crystals
✍ Scribed by Mutlu Avci; Serhan Yamacli
- Book ID
- 104046699
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 406 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0895-7177
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