✦ LIBER ✦
Negative bias temperature instability (NBTI) in SiO2 and SiON gate dielectrics understood through disorder-controlled kinetics
✍ Scribed by B. Kaczer; V. Arkhipov; M. Jurczak; G. Groeseneken
- Book ID
- 108207472
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 165 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0167-9317
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