✦ LIBER ✦
Necessary and sufficient conditions for hazard-free robust transistor stuck-open-fault testability in multilevel networks
✍ Scribed by Bryan, M.J.; Devadas, S.; Keutzer, K.
- Book ID
- 119777595
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 495 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0278-0070
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