Near tip stress intensity factor for an edge-crack in a Pb(ZrxTi1−x)O3 thin film with 90° domain switching under a continuous laser irradiation
✍ Scribed by B. Wu; X.J. Zheng; H.P. Hu; D.H. Li; Y. Ma; Y.C. Zhou
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 521 KB
- Volume
- 76
- Category
- Article
- ISSN
- 0013-7944
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✦ Synopsis
a b s t r a c t
The near tip stress intensity factor K I tip for an edge-crack in a Pb(Zr x Ti 1Àx )O 3 thin film was investigated by superposition of the applied stress intensity factor K I app under a continuous laser irradiation and the shielding stress intensity factor DK I for 90°domain switching. Both K I app and DK I were solved by the weight function method, and switching toughening was analyzed based on the small scale domain switching theory. Results show that K I tip of the edge-crack in the thin film is significantly affected by the initial poling angle, and the edge-crack tip is toughened by the domain switching area with the increase of the initial poling angle. The methodology can predict the fracture toughening of Pb(Zr x Ti 1Àx )O 3 thin films quantitatively.