Interface characterization of a ฮฒ-SiC wh
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Z. R. Liu; D. Z. Wang; C. K. Yao; J. F. Mao; D. X. Li
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Article
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1996
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Springer
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English
โ 511 KB
The nature of the interface, the orientation relationship of 13-SIC whisker (13-SiCw)-AI combination, and the misfit dislocation structures at the 13-SiCw-AI interfaces in a 13-SiCw-AI composite have been observed by a high-resolution transmission electron microscopy (HRTEM). It was shown that quite