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Near-Field Millimeter-Wave Imaging of Exposed and Covered Fatigue Cracks

✍ Scribed by Kharkovsky, S.; Ghasr, M.T.; Zoughi, R.

Book ID: 114631537
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 315 KB
Volume: 58
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2009.2022380

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[organized And Sponsored By Scientific Council Of The National Academy Of Sciences Of Ukraine On Radio-physics And Microwave Electronics]. Ieee Catalog Number: 01ex429--cover. Includes Bibliographical References And Author Index.