Near-field imaging of light diffraction out of slab waveguides

✍ Scribed by V.S. Volkov; S.I. Bozhevolnyi; D. Taillaert

• Book ID: 102448976
• Publisher: John Wiley and Sons
• Year: 2004
• Tongue: English
• Weight: 235 KB
• Volume: 1
• Category: Article
• ISSN: 1612-2011
• DOI: 10.1002/lapl.200410072

✦ Synopsis

A collection scanning near-field optical microscope
(SNOM) is used to image the propagating of light at
telecommunication wavelengths (1520-1570 nm) along photonic
crystal (PhC) slabs, which combine slab waveguides with in-plane
PhCs consisting of one- and two-dimensional gratings. The
efficient out-of-plane light diffraction is directly observed for
both 1D and 2D gratings (period 590 nm) fabricated on
silicon-on-insulator wafers and the corresponding SNOM images are
presented. Using the obtained SNOM images, we analyze light
intensity distributions along diffraction gratings measured at
different wavelengths and/or distances from the sample surface.