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Near-field FTIR imaging: A technique for enhancing spatial resolution in FTIR microscopy

✍ Scribed by Jennifer J. Sahlin; Nikolaos A. Peppas


Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
181 KB
Volume
63
Category
Article
ISSN
0021-8995

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✦ Synopsis


Fourier transform infrared (FTIR) microscopy is a powerful analytical technique for characterization of polymeric materials. In certain applications, however, it would be advantageous to obtain higher spatial resolution than what is presently feasible. This contribution reviews the key principles of FTIR microscopy and presents a design enhancement that increases the spatial resolution that may be obtained with a standard FTIR microscope. Representative results are shown, which illustrate the technique's effectiveness.