Near-edge x-ray absorption fine structure and Raman characterization of amorphous and nanostructured carbon films

✍ Scribed by Lenardi, C.; Piseri, P.; Briois, V.; Bottani, C. E.; Bassi, A. Li; Milani, P.

• Book ID: 120644431
• Publisher: American Institute of Physics
• Year: 1999
• Tongue: English
• Weight: 433 KB
• Volume: 85
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.370527