✦ LIBER ✦
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions
✍ Scribed by I. Manić; D. Danković; A. Prijić; V. Davidović; S. Djorić-Veljković; S. Golubović; Z. Prijić; N. Stojadinović
- Book ID
- 113800490
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 370 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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