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NBTI Lifetime Prediction and Kinetics at Operation Bias Based on Ultrafast Pulse Measurement

✍ Scribed by Zhigang Ji; Lin, L.; Jian Fu Zhang; Kaczer, B.; Groeseneken, G.

Book ID: 114619883
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 409 KB
Volume: 57
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2037171

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