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Nature of the Defect Determining the Fermi Level Stabilization in Irradiated Silicon

✍ Scribed by Lugakov, P. F. ;Lukashevich, T. A. ;Shusha, V. V.


Publisher
John Wiley and Sons
Year
1982
Tongue
English
Weight
561 KB
Volume
74
Category
Article
ISSN
0031-8965

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