Natural ageing effects of Schottky-gate GaAs FETs in current-voltage characteristics and in 1/f noise spectrum

✍ Scribed by A. V. Moryashin; S. V. Obolensky; M. Yu. Perov; A. V. Yakimov

• Book ID: 106511819
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 632 KB
• Volume: 50
• Category: Article
• ISSN: 0033-8443
• DOI: 10.1007/s11141-007-0012-1