✦ LIBER ✦
Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy
✍ Scribed by P. Keil; R. Frahm; D. Lützenkirchen-Hecht
- Book ID
- 116385472
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 825 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0010-938X
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