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Native defect properties in β-SiC: Ab initio and empirical potential calculations

✍ Scribed by Fei Gao; Eric J. Bylaska; William J. Weber; L.René Corrales

Book ID
114164740
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
94 KB
Volume
180
Category
Article
ISSN
0168-583X

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