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Nanotomography with enhanced resolution using bimodal atomic force microscopy

✍ Scribed by Dietz, C.; Zerson, M.; Riesch, C.; Gigler, A. M.; Stark, R. W.; Rehse, N.; Magerle, R.


Book ID
121185927
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
603 KB
Volume
92
Category
Article
ISSN
0003-6951

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