The single crystals of the ternary system based on Bi 2-x Tl x Se 3 (nominaly x = 0.0-0.1) were prepared using the Bridgman technique. Samples with varying content of Tl were characterized by the measurement of lattice parameters, electrical conductivity Ο β₯c , Hall coefficient R H (B||c), and Seebe
β¦ LIBER β¦
Nanostructured Bi2Se3 Films and Their Thermoelectric Transport Properties
β Scribed by Xiaofeng Qiu; Leah N. Austin; Philip A. Muscarella; Jeffrey S. Dyck; Clemens Burda
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 229 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0044-8249
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Thermoelectric properties of Tl-doped Bi
β
P. JanΓΔek; Δ. DraΕ‘ar; L. BeneΕ‘; P. LoΕ‘Ε₯Γ‘k
π
Article
π
2009
π
John Wiley and Sons
π
English
β 213 KB
π 2 views
Solution Route to PbSe Films with Enhanc
β
Zhengliang Sun; Shengcong Liufu; Xihong Chen; Lidong Chen
π
Article
π
2010
π
John Wiley and Sons
π
English
β 362 KB
ChemInform Abstract: Solution Route to P
ChemInform Abstract: Solution Route to PbSe Films with Enhanced Thermoelectric Transport Properties.
β
Zhengliang Sun; Shengcong Liufu; Xihong Chen; Lidong Chen
π
Article
π
2010
π
John Wiley and Sons
β 17 KB
π 1 views
Optical Properties of Bismuth Telluride
β
Kaddouri, El. H. ;Maurice, T. ;Gratens, X. ;Charar, S. ;Benet, S. ;Mefleh, A. ;T
π
Article
π
1999
π
John Wiley and Sons
π
English
β 159 KB
π 1 views
ChemInform Abstract: Synthesis of Micro/
β
Yali Li; Jun Jiang; Gaojie Xu; Wei Li; Limei Zhou; Yong Li; Ping Cui
π
Article
π
2009
π
John Wiley and Sons
β 16 KB
π 1 views
Controllable synthesis of novel In2O3 na
β
Yanjun Huang; Ke Yu; Ziqiang Zhu
π
Article
π
2010
π
John Wiley and Sons
π
English
β 217 KB
π 1 views
Three kinds of novel indium oxide (In 2 O 3 ) nanostructures, namely, nanorods, nanoflowers and nanowhiskers were synthesized on silicon substrate via a simple vapor-phase transport method under atmospheric pressure. The In 2 O 3 nanostructures were characterized by X-ray diffraction (XRD), scanning