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Nanoscopic evaluation of semiconductor properties by scanning probe microscopies

✍ Scribed by L.J. Balk; R. Heiderhoff; P. Koschinski; M. Maywald

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 744 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)00194-1

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