Scanning Tunneling Microscopy Has Achieved Remarkable Progress And Become The Key Technology For Surface Science. This Book Predicts The Future Development For All Of Scanning Probe Microscopy (spm). Such Forecasts May Help To Determine The Course Ultimately Taken And May Accelerate Research And Dev
โฆ LIBER โฆ
[NanoScience and Technology] Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 || Exploring Mesoscale Contact Mechanics by Atomic Force Microscopy
โ Scribed by Bhushan, Bharat
- Book ID
- 120226038
- Publisher
- Springer Berlin Heidelberg
- Year
- 2012
- Weight
- 618 KB
- Category
- Article
- ISBN
- 3642254144
No coin nor oath required. For personal study only.
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The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive