Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy

✍ Scribed by Gigler, Alexander M.; Huber, Andreas J.; Bauer, Michael; Ziegler, Alexander; Hillenbrand, Rainer; Stark, Robert W.

• Book ID: 115412340
• Publisher: Optical Society of America
• Year: 2009
• Tongue: English
• Weight: 423 KB
• Volume: 17
• Category: Article
• ISSN: 1094-4087
• DOI: 10.1364/OE.17.022351