✦ LIBER ✦
Nanoscale electrical characterization of ultrathin high-k dielectric MOS stacks: A conducting AFM study
✍ Scribed by H.J. Uppal; S. Bernardini; E. Efthymiou; S.N. Volkos; A. Dimoulas; V. Markevich; B. Hamilton; A.R. Peaker
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 645 KB
- Volume
- 11
- Category
- Article
- ISSN
- 1369-8001
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