Nanoscale deformation measurement by using the hybrid method of gray-level and holographic interferometry

✍ Scribed by C.H. Chien; Y.D. Wu; Y.T. Chiou; C.C. Hsieh; Y.C. Chen; T.P. Chen; M.L. Tsai; C.T. Wang

• Book ID: 108233273
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 292 KB
• Volume: 44
• Category: Article
• ISSN: 0143-8166
• DOI: 10.1016/j.optlaseng.2004.12.011