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Nanoparticle detection using dual-phase interferometry

โœ Scribed by Deutsch, Bradley ;Beams, Ryan ;Novotny, Lukas


Book ID
115355319
Publisher
The Optical Society
Year
2010
Tongue
English
Weight
326 KB
Volume
49
Category
Article
ISSN
1559-128X

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Phase shifting holographic interferometry is shown to be a useful tool for detection of internal defects in materials by observing strain anomalies in a stressed object. The postrecording signal processing includes smoothing of the measured deformation by means of data polynomial fitting, a derivati