Nanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy

✍ Scribed by Ogawa, Y.; Minami, F.; Abate, Yohannes; Leone, Stephen R.

• Book ID: 115439949
• Publisher: American Institute of Physics
• Year: 2010
• Tongue: English
• Weight: 382 KB
• Volume: 96
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3309692