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Nanometer recording on graphite and Si substrate using an atomic force microscope in air: Hosaka, S; Koyanagi, H; Kikukawa, A. Japanese Journal of Applied Physics, Part 2 (Letters). 1993 Mar 15


Book ID
107889186
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
137 KB
Volume
15
Category
Article
ISSN
0141-6359

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