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Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devices: Uncertainty propagation analysis and experiments

✍ Scribed by Muzheng Xiao; Satomi Jujo; Satoru Takahashi; Kiyoshi Takamasu


Book ID
113861475
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
965 KB
Volume
36
Category
Article
ISSN
0141-6359

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