Nanometer CMOS ICs: From Basics to ASICs

✍ Scribed by Harry J.M. Veendrick (auth.)

Publisher: Springer International Publishing
Year: 2017
Tongue: English
Leaves: 638
Edition: 2
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.

✦ Table of Contents

Front Matter....Pages i-xxxvii
Basic Principles....Pages 1-44
Geometrical-, Physical- and Field-Scaling Impact on MOS Transistor Behaviour....Pages 45-72
Manufacture of MOS Devices....Pages 73-159
CMOS Circuits....Pages 161-225
Special Circuits, Devices and Technologies....Pages 227-247
Memories....Pages 249-320
Very Large Scale Integration (VLSI) and ASICs....Pages 321-380
Less Power, a Hot Topic in IC Design....Pages 381-427
Robustness of Nanometer CMOS Designs: Signal Integrity, Variability and Reliability....Pages 429-493
Testing, Yield, Packaging, Debug and Failure Analysis....Pages 495-571
Effects of Scaling on MOS IC Design and Consequences for the Roadmap....Pages 573-594
Back Matter....Pages 595-611

✦ Subjects

Circuits and Systems;Electronic Circuits and Devices;Electronics and Microelectronics, Instrumentation

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