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Nanolocalized charge writing in thin SiO2layers with embedded silicon nanocrystals under an atomic force microscope probe

✍ Scribed by M. S. Dunaevskii; A. N. Titkov; S. Yu. Larkin; A. B. Speshilova; S. E. Aleksandrov; C. Bonafos; A. Claverie; R. Laiho


Book ID
111449868
Publisher
SP MAIK Nauka/Interperiodica
Year
2007
Tongue
English
Weight
269 KB
Volume
33
Category
Article
ISSN
1063-7850

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