Nanohardness of a Ti Thin Film and Its Interface Deposited by an Electron Beam on a 304 SS Substrate

✍ Scribed by R.A. Vieira; M.C.A. Nono; N.C. Cruz

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 116 KB
• Volume: 232
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200207)232:1<116::aid-pssb116>3.0.co;2-1