✦ LIBER ✦
Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy
✍ Scribed by S. Kanjanachuchai; Y. Tsuchiya; K. Usami; S. Oda
- Book ID
- 113797644
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 342 KB
- Volume
- 73-74
- Category
- Article
- ISSN
- 0167-9317
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