✦ LIBER ✦

Nano-world in motion

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 413 KB
Volume: 7
Category: Article
ISSN: 1369-7021
DOI: 10.1016/s1369-7021(04)00646-7

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✦ Synopsis

Durable SiN SPM sensor

NanoWorld™ has introduced a Hybrid-Nitride™ sensor for contact-mode scanning probe microscopy (SPM). The SiN-based sensor offers low cantilever bending, resistance to wear, and extended lifetime. The oxidesharpened tips have a height of 4 µm and a typical radius of less than 15 nm. Single holder chips make the SPM sensors easy to handle.

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