Nano-Thermal Analysis : Application to Studies of Polymer Blends

✍ Scribed by Nicolaas-Alexander Gotzen.ir; Guy Van Assche

• Publisher: Wiley (John Wiley & Sons)
• Year: 2007
• Weight: 569 KB
• Volume: 9
• Category: Article
• ISSN: 1439-4243
• DOI: 10.1002/imic.200790144

✦ Synopsis

In the last decennia there has been a substantial and growing interest in polymer 'thin' films. These films (typically below 200 nm thickness) show remarkable properties, sometimes completely different from those in bulk. Understanding how the morphology of thin polymer (blend) films evolves with time or preparation methods is of great technological importance [1].

Nano-thermal Analysis

AFM turns out to be the suited technique for studying these films. It is possible to determine different images (e.g. topographic, friction and phase) in one scan. The Anasys Instruments Nano-thermal analyser (nano-TA) add-on used in this work combines the normal AFM modes with spatially resolved thermal analysis. Using a silicon thermal probe, nanometer lateral resolution can be obtained for the thermal analysis, in contrast to the micrometer resolution of the Wollaston thermal probe used in micro-TA [2]. The recorded thermal analysis signal allows one to determine the transition temperature (melting, glass transition temperature) on selected spots of the sample, aiding in the identification and characterization of the phases.