Nano-scratch, nanoindentation and fretting tests of 5–80nm ta-C films on Si(100)

✍ Scribed by Beake, B.D.; Davies, M.I.; Liskiewicz, T.W.; Vishnyakov, V.M.; Goodes, S.R.

• Book ID: 120194159
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 798 KB
• Volume: 301
• Category: Article
• ISSN: 0043-1648
• DOI: 10.1016/j.wear.2013.01.073