✦ LIBER ✦
Nano-regime Length Scales Extracted from the First Sharp Diffraction Peak in Non-crystalline SiO2and Related Materials: Device Applications
✍ Scribed by Gerald Lucovsky; James C. Phillips
- Book ID
- 107470645
- Publisher
- Springer-Verlag
- Year
- 2010
- Tongue
- English
- Weight
- 676 KB
- Volume
- 5
- Category
- Article
- ISSN
- 1931-7573
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