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N, NH, and NH[sub 2] radical densities in a remote Ar–NH[sub 3]–SiH[sub 4] plasma and their role in silicon nitride deposition

✍ Scribed by van den Oever, P. J.; van Helden, J. H.; van Hemmen, J. L.; Engeln, R.; Schram, D. C.; van de Sanden, M. C. M.; Kessels, W. M. M.


Book ID
120990604
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
888 KB
Volume
100
Category
Article
ISSN
0021-8979

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