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Mössbauer spectroscopy and X-ray diffraction study of 304 L stainless steel thin films

✍ Scribed by B. Boubeker; J.P. Eymery; Ph. Goudeau; E.L.H. Sayouty

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
111 KB
Volume
46
Category
Article
ISSN
0969-8043

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✦ Synopsis

Marocco) * On leave from : Facult6 des Sciences II Ben M'Sick, Casablanca (Marocco) 304 L stainless steel (SS) films were elaborated using an ion-beam sputtering techniquel The target material was a sheet of commercial grade 304 L SS. It was first analysed by both conversion electron Mt)ssbauer spectroscopy (CEMS) and X-ray diffraction. The non-magnetic state and austenitic f.c.c, structure (y-phase) of this material were established.

As-sputtered state

The films were deposited on various substrates with thicknesses in the 175-800 nm range. They

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