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Mutual compensation of mobility and threshold voltage temperature effects with applications in CMOS circuits

✍ Scribed by Filanovsky, I.M.; Allam, A.

Book ID: 115534889
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 238 KB
Volume: 48
Category: Article
ISSN: 1057-7122
DOI: 10.1109/81.933328

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