Multistate device redundant systems with common-cause failures and one standby unit: Balbir S. Dhillon. Microelectron. Reliab. 20, 411 (1980)

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 124 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90294-8