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Multiquantity intelligent measurement system for investigating thermal properties of semiconductor devices: K. Kowalski, H. Chacinski, A.J. Wieckowski (Inst. of Radioelectron., Techn. Univ. of Warsaw, Poland) 5th International IMEKO symposium on Intelligent Measurement, Jena, Germany, 10–14 June 1986 (Budapest, Hungary: IMEKO 1986) vol. 2, pp 231-3


Book ID
108361454
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
99 KB
Volume
18
Category
Article
ISSN
0026-2692

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