Multiple-threshold-voltage CMOS/SOS by focused ion beams

✍ Scribed by J.Y. Lee; W.M. Clark; M.W. Utlaut

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 311 KB
• Volume: 31
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(88)90123-2