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Multiphase BIST: a new reseeding technique for high test-data compression

✍ Scribed by Kalligeros, E.; Kavousianos, X.; Nikolos, D.

Book ID: 117907226
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 791 KB
Volume: 23
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2004.833617

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