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Multiperiod fringe projection interferometry using a backpropagation method for surface profile measurement

✍ Scribed by Huan, Hai ;Sasaki, Osami ;Suzuki, Takamasa


Book ID
115353686
Publisher
The Optical Society
Year
2007
Tongue
English
Weight
852 KB
Volume
46
Category
Article
ISSN
1559-128X

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## Abstract In this article the Fourier transform method is applied to analyze multiple‐beam interference Fizeau fringes. The real part of the inverse Fourier transform is used to estimate a theoretical pattern. This pattern coincides with the experimental one. A derivative‐sign binary image of the