✦ LIBER ✦
Multiparameter Admittance Spectroscopy as a Diagnostic Tool for Interface States at Oxide/Semiconductor Interfaces
✍ Scribed by Raeissi, B.; Piscator, J.; Engstrom, O.
- Book ID
- 114620014
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 701 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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