✦ LIBER ✦
Multilevel Full-Chip Routing With Testability and Yield Enhancement
✍ Scribed by Shu-Min Li, K.; Yao-Wen Chang; Chung-Len Lee; Chauchin Su; Chen, J.E.
- Book ID
- 117907883
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 651 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0278-0070
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