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Multilayer approach to the quantitative analysis of x-ray photoelectron spectroscopy results: Applications to ultrathin SiO[sub 2] on Si and to self-assembled monolayers on gold

✍ Scribed by van der Marel, C.; Yildirim, M.; Stapert, H. R.


Book ID
126198380
Publisher
AVS (American Vacuum Society)
Year
2005
Tongue
English
Weight
532 KB
Volume
23
Category
Article
ISSN
0734-2101

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