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Multifrequency eddy current diagnostics of axial and radial thermal profiles during silicon crystal growth

✍ Scribed by Jerry A. Stefani; John K. Tien; Kwang Su Choe; John P. Wallace


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
805 KB
Volume
106
Category
Article
ISSN
0022-0248

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